Nanonics Imaging: SpectraView 2500

  • MultiDimensional NanoCharacterization
  • UltraLow Noise In X, Y And Z
  • Advanced Near-Field Scanning Optical Microscopy (NSOM)
  • Capable of Live Cell NSOM Nanophotonics
  • Versatile configurations with advanced SPM modes of operation: Kelvin Probe chemical potential, electrical, thermal and photon force detection
  • Applications in plasmonics of 2D materials, liquids, biology, etc.
  • Colocalized IR, Raman, THz and AFM
  • Singular protocols for excitation in the IR with Raman and fluorescence detection in the visible
  • Image with photon force with pN force sensitivity
  • Patented cantilevered completely transparent probes
  • Highly localized scattering at the tip
  • Online variable magnetic fields

Description

INTEGRATING SCATTERING TECHNIQUES WITH ULTRASENSITIVE SCANNING FORCE MICROSCOPY (SFM) AND ATOMIC FORCE MICROSCOPY (AFM)

Nanonics Imaging SpectraView 2500 is a compact, ultra-low noise Scanning Probe Microscope (SPM) offering some of the highest resolution and force-sensitivity commercially available today. It offers all modes of Atomic Force Microscopy (AFM): contact, tapping, non-contact, and elasticity mapping, along with other standard protocols. The SpectraView 2500 integrates with inverted microscopes, dual microscopes, magnets, and a variety of microscopes including Raman and Fluorescence. The SpectraView 2500 can be placed on the stage of an upright microscope for viewing opaque samples using high aperture objectives. The SpectraView 2500 comes with the Nanonics NanoToolKit of probes which permits a full range of SPM applications without obstructing the optical axis from above.

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