INTEGRATING SCATTERING TECHNIQUES WITH ULTRASENSITIVE SCANNING FORCE MICROSCOPY (SFM) AND ATOMIC FORCE MICROSCOPY (AFM)
Nanonics Imaging SpectraView 2500 is a compact, ultra-low noise Scanning Probe Microscope (SPM) offering some of the highest resolution and force-sensitivity commercially available today. It offers all modes of Atomic Force Microscopy (AFM): contact, tapping, non-contact, and elasticity mapping, along with other standard protocols. The SpectraView 2500 integrates with inverted microscopes, dual microscopes, magnets, and a variety of microscopes including Raman and Fluorescence. The SpectraView 2500 can be placed on the stage of an upright microscope for viewing opaque samples using high aperture objectives. The SpectraView 2500 comes with the Nanonics NanoToolKit of probes which permits a full range of SPM applications without obstructing the optical axis from above.