Atomic Force Microscopy Solutions
Nanonics Imaging is headquartered in Israel and is a pioneer in atomic force microscopy (AFM) systems. AFM provides a variety of nanometric characterizations such as topography, conductivity, and thermal measurements. Nanonics Imaging’s Hydra BioAFM, MultiView 4000, and SpectraView 2500 offer integration with one or a combination of: Bio-Imaging Applications, Terahertz Spectroscopy, Cryogenic Systems, High Magnetic Field Studies, and Tip Enhanced Raman Scattering (TERS). Learn more about Atomic Force Microscopy here.
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Vivid Imaging Soft Touch Atomic Force Microscopy (VISTA)
Nanonics Imaging VISTA offers ultra-sensitive single pN force mapping combined with the benefits of super-resolution optical and fluorescent imaging.
VISTA allows for the highest force sensitivity of any AFM: down to single pNs.
AFM with a Large Z Range
Nanonics probes and scanners enable imaging of high aspect ratio deep trenches and protrusions not previously possible:
- Large Z scanning range: 85µ
- Long tip length of >100µ or greater
- Very high 10:1 aspect ratio glass probes
The Nanonics Imaging MultiView 4000 enables the utilization of up to four probes for independent imaging and manipulation of a sample. This platform can integrate AFM, Raman, and Tip Enhanced Raman Spectroscopy (TERS). You can measure electrical, thermal, and optical properties and conduct advanced experiments such as nanoscale transport, optical pump-probe, and read-write experiments.
Learn more about Nanonics Imaging at http://www.nanonics.co.il/